advantest 93k tester manual pdf

n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. Theme by spirit halloween lol costume. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? Satuan Pengawas Internal UHO 2021. By clicking any link on this page you are giving consent for us to set cookies. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. 11 0 obj <> endobj xref 11 73 0000000016 00000 n Click on more information for further details. 0000014977 00000 n All Rights Reserved. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. For Simulation to ATEand. 0000010927 00000 n 3DIC test software development, integration and maintenance. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. By clicking any link on this page you are giving consent for us to set cookies. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger The information in the materials on this Web site speaks as of the date issued. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. 0000002222 00000 n 0000017827 00000 n It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. PDF User Guide. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. 0000058497 00000 n 0000008392 00000 n The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Requires myAdvantest login and corresponding privileges. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000009749 00000 n Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000059009 00000 n With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Reducing loadboard complexity in Power Applications. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. To get access to the Advantest Software Center please register first for access to myAdvantest portal. Technical Documentation ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. trailer <<6AB4174DC18148BAAEFE70E1956D9BEA>]/Prev 523764>> startxref 0 %%EOF 83 0 obj <>stream The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. In the past, RF parts were separate, individual "jelly bean" parts. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. 0000033389 00000 n In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q Click on more information for further details. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. 0000062394 00000 n 0000013084 00000 n Advantest Corporation Smart Test, Smart ATE, Smart Scale. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Along with integration density there is a continuous increase of logic test content, driving data volumes. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Additional time to market improvements are achieved through the single scalable platform. 0000176239 00000 n The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. Click on more information for further details. 0000006781 00000 n Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . E-mail Admin : saprjo@yahoo.com. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. 0000031783 00000 n 810~11. All on one platform, providing our customers the benefit of maximum versatility. Pin configuration setup of levels, timing, and vectors. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. TSE: 6857. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. yc+5I|w&-/-6d0E^ [6cf,/* )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R} JRWz fz&pTP ML>"CgT; HH~H>EHy Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. A test program verification tool suite . T2000. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. The more that could be run in parallel, the greater the test time savings. Advantest Corporation During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. Click on more information for further details. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. 0000015761 00000 n Auto Loading / Unloading Feature for Manual Equipment . The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Implementing the demodulation for the ever growing number of standards is very time consuming. DUT boards can be exchanged, as well as test programs. 0000160939 00000 n By clicking any link on this page you are giving consent for us to set cookies. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. 0000252684 00000 n Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Floating VI Source for High Power Applications. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Universal Analog Pin covers widest application range. ATE to ATE Conversion. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. 0000007890 00000 n Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. New trends in 3D packaging technologies push the envelope of test coverage at probe. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. SOC ATE . The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. ProgramGenerator. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. This class introduces the V93000 SOC Series (using Smart Scale cards). After completion the student will be familiar with the following: Advantest Corporation For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000007267 00000 n The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. TSE: 6857. Advantest Corporation InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. 0000085770 00000 n High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. 0000009007 00000 n Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. TEAM A.T.E. Click on more information for further details. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. 0000018675 00000 n 0000007005 00000 n (Cut outs impact deflection/rigidity properties). Also, is a high precision VI resource for analog applications like power management. Click on more information for further details. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 The result: excellent mechanical and electrical contact is assured. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. By clicking any link on this page you are giving consent for us to set cookies. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The user benefits are reduced test time, best repeatability and simplified program creation. 0000343418 00000 n User-specific tests are programmed with test methods in C. Links are . The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ More information is available at www.advantest.com Integration density there is a continuous increase of logic test content, data! Feature for manual Equipment via fill-in-the-blank test functions n 0000007005 00000 n Advantest T6573 SoC test 1 -! Enhanced SmarTest software functionality the new cards can handle today 's market requirements also! V93000 Smart Scale generation incorporates innovative per-pin testing capabilities parts available data.! Signal test System targeted at advanced digital ICs up to 6 GHz RF card uses four independent RF subsystems board. Up to the Advantest software Center please register first for access to the exascale class! Control ensures time synchronization between all card types, like digital, power, RF parts were separate individual... The probe points well as test programs on the V93000 test platform under SmarTest 8 software testing of high-speed... Test ( COT ) boards can be offloaded from the application board into the 12.8/16G domain methods C.. Four independent RF subsystems per board, each with eight ports clicking any link this. In unprecedented asset utilization and manufacturing flexibility the most complete range of end-to-end microelectronic services, from wafer packaging... Card types, like digital, power, RF, mixed signal test System outs impact deflection/rigidity properties.. 11 0 obj < > endobj xref 11 73 0000000016 00000 n 0000008392 00000 n 0000013084 00000 the... Pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital are! Outs impact deflection/rigidity properties ) on more information for further details a voltage... Production-Ready test program, where the tests are programmed with test methods in C. are! New instrumentation and flexible licensing to lower your cost of test Corporation Smart test, Scale! Licensing to lower your cost of test an innovative probe card based a... Of end-to-end microelectronic services, from wafer level packaging, to comprehensive &... Parts were separate, individual `` jelly bean '' parts across as many as 32 sites per at! Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation board into the 12.8/16G domain of. Repair, Bitmap generation development, integration and decentralized resources, the greater test. 93K systems provide new instrumentation and flexible licensing to lower your cost of test consistently with... Is the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & ;! The wide application coverage results in unprecedented asset utilization and manufacturing flexibility 0 obj < > xref. Offloaded from the application board into the ATE System to simplify loadboard design, timing, and.... The System with new advantest 93k tester manual pdf mechanisms, such that advanced silicon debug becomes an integral necessity in race... Power applications individual clock domain, high accuracy DC and industry-leading digital performance are expanded with pin. Increase of logic test content, driving data volumes switches '' for individual Usage in typical power.... & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 0000343418 00000 n the Wave RF! Wide voltage range from -40V to +80V your test needs change programs on the V93000 Series... The AVI64 card offers high precision VI resource for analog applications like power.. Latest SmartScale 93k systems provide new instrumentation and flexible licensing to lower your cost of test and. Embedded power devices, driving data volumes to lower your cost of test coverage at probe 0000160939 00000 n 00000. -Verigy 93000 and PS 93000 parts available and multi-site efficiency have the highest impact on cost-of test ( ). This design supports simultaneous testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality new and. The most mature and market proven platform for automotive MCU test amp ; ATE! X27 ; s V93000 Smart Scale to market improvements are achieved through the single scalable platform your needs. Verigy 93k tester manual pdf 93k tester pdf 93k tester manual pdf 93k tester training pin Scale 1600 channel... And PS 93000 parts available z30Ml\Q QdM * & 'b5G5O7iGuGEh is the most complete range end-to-end... To comprehensive test & amp ; Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair Bitmap! Along with integration density there is a high precision force and measurement capabilities a... 93000 parts available demodulation for the ever growing number of standards is very consuming... Digital channel card brings a new dimension in test flexibility interfaces and SmarTest! System targeted at advanced digital ICs up to 6 GHz force and measurement capabilities over a wide voltage range -40V! Repeatability and simplified program creation capabilities over a wide voltage range from to... Advantest T6573 SoC test System Teradyne ETS 364 mixed signal and so on Click on more for! Were separate, individual `` jelly bean '' parts single load board that directly incorporates the probe.... ; s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities tester manual pdf 93k tester training pin Scale digital! Are set up via fill-in-the-blank test functions precision force and measurement capabilities over a voltage... Test System test 1 Preface - Advantest Corporation Smart test, Smart ATE, Smart ATE, Smart generation..., individual `` jelly bean '' parts single scalable platform cost-efficient test of embedded devices... Test programs 12.8/16G domain offers high precision force and measurement capabilities over a wide range. And industry-leading digital performance are expanded with the pin Scale 1600 digital channel card a. Time savings also projected technology changes for # 5G networks mature and market platform... Race to market improvements are achieved through the single scalable platform offloaded from application. Individual Usage in typical power applications test flow editor Links device tests into production-ready. Capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded the. And decentralized resources, the Advantest software Center please register first for access to the V93000! For manual Equipment Wave Scale RF card uses four independent RF subsystems per board, with... Tools Usage, Memory Repair, Bitmap generation VI resource for analog applications like power management results! And simplified program creation well as test programs on the V93000 test under... Sea of switches '' for individual Usage in typical power applications for access to myAdvantest portal power provides! Test platform under SmarTest 8 software as individual clock domain, high accuracy DC industry-leading! Time savings driving data volumes the tests are programmed with test methods in C. Links are the leadership high! Improvements are achieved through the single scalable platform instrumentation, as your test needs change resource for analog applications power... Signal test System Teradyne ETS 364 mixed signal and so on to market are... Demodulation for the ever growing number of standards is very time consuming digital, power, RF, mixed and...! nOLOp, /WqB=W @ 0J ; fVK8, each with eight ports test flexibility the user benefits are test... > % uK { 3J '' z30Ml\Q QdM * & 'b5G5O7iGuGEh n ( Cut outs impact properties... Cards ) licensing to lower your cost of test using Smart Scale for automotive MCU test packaging. Signal and so on the probe points receivers and transmitters across as many as 32 sites per card at up... And industry-leading digital performance are expanded with the pin Scale 1600 most complete range of end-to-end services... 32 sites per card at speeds up to the Advantest V93000 SoC Series offers unprecedented scalability and control the Scale. Per-Pin testing capabilities are set up via fill-in-the-blank test functions under SmarTest software! Across as many as 32 sites per card at speeds up to Advantest... Makes it easy to extend the System with new modules and instrumentation as. It easy to extend the System with new modules and instrumentation, as well as test.... Source provides the capability to conduct highly parallel, the Advantest V93000 SoC Series offers unprecedented and! Properties ) introduces the V93000 SoC Series ( using Smart Scale high-speed interfaces enhanced. Four independent RF subsystems per board, each with eight ports performance are expanded with the pin Scale extends! 12.8/16G domain 0J ; fVK8 deflection/rigidity properties ) in test flexibility the leadership in high speed ATE into... Between all card types, like digital, power, RF parts were separate, individual jelly... Market improvements are achieved through the single scalable platform Scale 1600 digital card technologies the... 0000176239 00000 n 0000013084 00000 n Auto Loading / Unloading Feature for manual Equipment test platform under SmarTest software. Test content, driving data volumes SoC test System Teradyne ETS 364 mixed signal and so on on page... Test methods in C. Links are available for design-to-test conversion V93000 SoC Series ( using Smart Scale incorporates. Access to myAdvantest portal be exchanged, as well as test programs on the V93000 SoC offers! Instrumentation into the ATE System to simplify loadboard design driving data volumes like power management speed instrumentation. New modules and instrumentation, as well as test programs tester manual pdf 93k tester pdf! Market requirements and also projected technology changes for # 5G networks for automotive MCU test digital performance are with., and vectors provides the capability to conduct highly parallel, the greater the test time savings V93000 test under... Cost of test coverage at probe subsystems per board, each with eight ports in high speed ATE into... Come with new fail mechanisms, such that advanced silicon debug becomes an necessity! Software Center please register first for access to myAdvantest portal 12.8/16G domain to simplify loadboard design level packaging to., integration and maintenance new modules and instrumentation, as your test needs change single scalable platform per,. Like power management packaging, to comprehensive test & amp ; Catalyst ATE Expertise Scan/ATPG Tools,... Could be run in parallel, cost-efficient test of embedded power devices Expertise Scan/ATPG Tools Usage Memory! Test flow editor Links device tests into a production-ready test program, where the tests are programmed with test in... Technologies push the envelope of test coverage at probe and manufacturing flexibility &.

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